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Scanning
Tunneling (STM), Atomic Force (AFM),
Field Ion (FIM),
Optical Fluorescence
Several imaging instruments are available
for studying surface morphology and structure.
These range from conventional optical microscopes
to Scanning Tunneling Microscopes (STM), Atomic
Force Microscopes (AFM), and Fluorescence Microscopes
that can resolve features spanning length scales
from micrometer to nanometer to atomic dimensions.
A Park Scientific M5 scanning force microscope (SFM) allows for sample characterization
in ambient conditions. It can operate in traditional contact mode with lateral
force capabilities as well as non-contact and intermittent contact modes.
A motorized translation stage allows large samples to be imaged as well as
to obtain a high degree of reproducibility in image location. The M5 has
liquid cell and force modulation capabilities as well as software for performing
lithography.
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 A JEOL JSPM-4500A scanning probe microscope has
both AFM and STM imaging capabilities in a UHV environment.
Samples may be heated in the instrument and imaged
at elevated temperatures (up to 400oC). Since the
microscope is integrated into the Thin
Film Synthesis and Characterization Facility , samples can be imaged
in situ following thin film growth, processing, and/or
other surface analysis without exposure to atmosphere.
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