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Well-defined
Contact Experiments in Controlled Environment
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Single
asperity experiments (1- 100 nm)
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Electrical
characterization of contact (tunneling-point
contact-contact)
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Contamination's
influence of contact (during contact)
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Surface
chemistry control
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Tribochemical
reaction mechanism
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Acquisition
of quantitative data to test molecular dynamic
simulations
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Quantitative
studies of different single asperity contacts:
W-tip/Au; W-tip/SS; W-tip/Ni, NiO; WC/Au, Ni,
NiO; TiC/Au, Ni;
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Adhesive
forces for clean and contaminated surfaces
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The
onset of plastic deformations
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Contact
area evaluation from contact resistance measurements
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Tribological
aspects at atomic and nanometric scale
The main components of our
system, i.e. electronic control unit, force sensor,
AFM-STM-FIM head, optical detection system, UHV
assembly, are home designed and fabricated.
Our system works as:
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Atomic
Force Microscope - AFM
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Scanning
Tunneling Microscope - STM
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Field
Ion Microscope - FIM
All these techniques are performed using the
same probing tip.
The UHV-system consists of:
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